气候变化领域集成服务门户(CCPortal): Improved Accuracy for Trace Element Analysis of Al and Ti in Quartz by Electron Probe Microanalysis

CCPortal

DOI	10.1017/S1431927618015672
	Improved Accuracy for Trace Element Analysis of Al and Ti in Quartz by Electron Probe Microanalysis
	Cui, Ji-Qiang; Yang, Shui-Yuan; Jiang, Shao-Yong; Xie, Jing
通讯作者	Yang, SY (通讯作者)
发表日期	2019
ISSN	1431-9276
EISSN	1435-8115
起始页码	47
结束页码	57
卷号	25 期号:1
英文摘要	The trace elements in quartz, Al and Ti, contain considerable information about mineral genesis, and determining their concentrations is of great importance in geology. Electron probe microanalysis has the advantages of non-destructive testing and high spatial resolution; however, it is a challenge to improve the accuracy and precision of trace element detection using this method. The important factors affecting accuracy include the fragility of quartz lattices at high beam currents and the methods used to determine the background. In this paper, the peaks of Al-K alpha and Ti-K alpha, and their backgrounds, were found to exhibit intensity variations at high beam currents and small beam diameters; therefore, it is necessary to select a large beam diameter (up to 20 mu m) to avoid variations in intensity at high currents (500 nA). For background determination of Al, a multipoint background method is proposed to determine the background value, which greatly improves the accuracy of the results. For Ti, the choice of background measurement does not affect the result. In addition, it is verified that the background obtained from other quartz samples can be used as the background of an unknown quartz sample, which reduces the analysis time and minimizes sample damage.
关键词	CATHODOLUMINESCENCE CHEMISTRY MICROPROBE GRANITE CRYSTALLIZATION TEXTURES INSIGHTS
英文关键词	background determination; electron probe microanalysis; quartz; time-dependent intensity; trace elements
语种	英语
WOS研究方向	Materials Science ; Microscopy
WOS类目	Materials Science, Multidisciplinary ; Microscopy
WOS记录号	WOS:000465593800005
来源期刊	MICROSCOPY AND MICROANALYSIS
来源机构	中国科学院青藏高原研究所
文献类型	期刊论文
条目标识符	http://gcip.llas.ac.cn/handle/2XKMVOVA/259416
推荐引用方式 GB/T 7714	Cui, Ji-Qiang,Yang, Shui-Yuan,Jiang, Shao-Yong,et al. Improved Accuracy for Trace Element Analysis of Al and Ti in Quartz by Electron Probe Microanalysis[J]. 中国科学院青藏高原研究所,2019,25(1).
APA	Cui, Ji-Qiang,Yang, Shui-Yuan,Jiang, Shao-Yong,&Xie, Jing.(2019).Improved Accuracy for Trace Element Analysis of Al and Ti in Quartz by Electron Probe Microanalysis.MICROSCOPY AND MICROANALYSIS,25(1).
MLA	Cui, Ji-Qiang,et al."Improved Accuracy for Trace Element Analysis of Al and Ti in Quartz by Electron Probe Microanalysis".MICROSCOPY AND MICROANALYSIS 25.1(2019).