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DOI10.1126/science.1166135
Four-dimensional electron microscopy
Zewail A.H.
发表日期2010
ISSN0036-8075
起始页码187
结束页码193
卷号328期号:5975
英文摘要The discovery of the electron over a century ago and the realization of its dual character have given birth to one of the two most powerful imaging instruments: the electron microscope. The electron microscope's ability to resolve three-dimensional (3D) structures on the atomic scale is continuing to affect different fields, including materials science and biology. In this Review, we highlight recent developments and inventions made by introducing the fourth dimension of time in electron microscopy. Today, ultrafast electron microscopy (4D UEM) enables a resolution that is 10 orders of magnitude better than that of conventional microscopes, which are limited by the video-camera rate of recording. After presenting the central concept involved, that of single-electron stroboscopic imaging, we discuss prototypical applications, which include the visualization of complex structures when unfolding on different length and time scales. The developed UEM variant techniques are several, and here we illucidate convergent-beam and near-field imaging, as well as tomography and scanning-pulse microscopy. We conclude with current explorations in imaging of nanomaterials and biostructures and an outlook on possible future directions in space-time, 4D electron microscopy.
英文关键词nanomaterial; electron microscopy; three-dimensional modeling; tomography; visualization; electron beam tomography; electron microscopy; molecular mechanics; priority journal; review; stroboscopy; three dimensional imaging; Animals; Crystallization; Crystallography; Electrons; Graphite; Microscopy, Electron, Scanning Transmission; Microscopy, Electron, Transmission; Nanostructures; Phase Transition; Physicochemical Processes; Time
语种英语
来源期刊Science
文献类型期刊论文
条目标识符http://gcip.llas.ac.cn/handle/2XKMVOVA/246144
作者单位Physical Biology Center for Ultrafast Science and Technology, California Institute of Technology, Pasadena, CA 91125, United States
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Zewail A.H.. Four-dimensional electron microscopy[J],2010,328(5975).
APA Zewail A.H..(2010).Four-dimensional electron microscopy.Science,328(5975).
MLA Zewail A.H.."Four-dimensional electron microscopy".Science 328.5975(2010).
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