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DOI | 10.1126/science.1166135 |
Four-dimensional electron microscopy | |
Zewail A.H. | |
发表日期 | 2010 |
ISSN | 0036-8075 |
起始页码 | 187 |
结束页码 | 193 |
卷号 | 328期号:5975 |
英文摘要 | The discovery of the electron over a century ago and the realization of its dual character have given birth to one of the two most powerful imaging instruments: the electron microscope. The electron microscope's ability to resolve three-dimensional (3D) structures on the atomic scale is continuing to affect different fields, including materials science and biology. In this Review, we highlight recent developments and inventions made by introducing the fourth dimension of time in electron microscopy. Today, ultrafast electron microscopy (4D UEM) enables a resolution that is 10 orders of magnitude better than that of conventional microscopes, which are limited by the video-camera rate of recording. After presenting the central concept involved, that of single-electron stroboscopic imaging, we discuss prototypical applications, which include the visualization of complex structures when unfolding on different length and time scales. The developed UEM variant techniques are several, and here we illucidate convergent-beam and near-field imaging, as well as tomography and scanning-pulse microscopy. We conclude with current explorations in imaging of nanomaterials and biostructures and an outlook on possible future directions in space-time, 4D electron microscopy. |
英文关键词 | nanomaterial; electron microscopy; three-dimensional modeling; tomography; visualization; electron beam tomography; electron microscopy; molecular mechanics; priority journal; review; stroboscopy; three dimensional imaging; Animals; Crystallization; Crystallography; Electrons; Graphite; Microscopy, Electron, Scanning Transmission; Microscopy, Electron, Transmission; Nanostructures; Phase Transition; Physicochemical Processes; Time |
语种 | 英语 |
来源期刊 | Science
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文献类型 | 期刊论文 |
条目标识符 | http://gcip.llas.ac.cn/handle/2XKMVOVA/246144 |
作者单位 | Physical Biology Center for Ultrafast Science and Technology, California Institute of Technology, Pasadena, CA 91125, United States |
推荐引用方式 GB/T 7714 | Zewail A.H.. Four-dimensional electron microscopy[J],2010,328(5975). |
APA | Zewail A.H..(2010).Four-dimensional electron microscopy.Science,328(5975). |
MLA | Zewail A.H.."Four-dimensional electron microscopy".Science 328.5975(2010). |
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