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DOI | 10.1016/j.scib.2021.04.018 |
Imaging the atomic-scale electronic states induced by a pair of hole dopants in Ca2CuO2Cl2 Mott insulator | |
Li H.; Ye S.; Zhao J.; Jin C.; Wang Y. | |
发表日期 | 2021 |
ISSN | 20959273 |
起始页码 | 1395 |
结束页码 | 1400 |
卷号 | 66期号:14 |
英文摘要 | We use scanning tunneling microscopy to visualize the atomic-scale electronic states induced by a pair of hole dopants in Ca2CuO2Cl2 parent Mott insulator of cuprates. We find that when the two dopants approach each other, the transfer of spectral weight from high energy Hubbard band to low energy in-gap state creates a broad peak and nearly V-shaped gap around the Fermi level. The peak position shows a sudden drop at distance around 4 a0 and then remains almost constant. The in-gap states exhibit peculiar spatial distributions depending on the configuration of the two dopants relative to the underlying Cu lattice. These results shed important new lights on the evolution of low energy electronic states when a few holes are doped into parent cuprates. © 2021 Science China Press |
关键词 | Charge transfer gapCupratesImpurity stateMott insulatorScanning tunneling microscopy |
英文关键词 | Calcium compounds; Chlorine compounds; Copper compounds; Electronic states; Mott insulators; Scanning tunneling microscopy; Atomic scale; Ca$+2+$; Charge-transfer gap; Cuprates; Energy; Impurity state; In-gap state; Lower energies; Mott insulators; Spectral weight; Charge transfer |
语种 | 英语 |
来源期刊 | Science Bulletin
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文献类型 | 期刊论文 |
条目标识符 | http://gcip.llas.ac.cn/handle/2XKMVOVA/207460 |
作者单位 | State Key Laboratory of Low Dimensional Quantum Physics, Department of Physics, Tsinghua University, Beijing, 100084, China; Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing, 100190, China; Songshan Lake Materials Laboratory, Dongguan, 523808, China; School of Physical Sciences, University of Chinese Academy of Sciences, Beijing, 100049, China; Frontier Science Center for Quantum Information, Beijing, 100084, China |
推荐引用方式 GB/T 7714 | Li H.,Ye S.,Zhao J.,et al. Imaging the atomic-scale electronic states induced by a pair of hole dopants in Ca2CuO2Cl2 Mott insulator[J],2021,66(14). |
APA | Li H.,Ye S.,Zhao J.,Jin C.,&Wang Y..(2021).Imaging the atomic-scale electronic states induced by a pair of hole dopants in Ca2CuO2Cl2 Mott insulator.Science Bulletin,66(14). |
MLA | Li H.,et al."Imaging the atomic-scale electronic states induced by a pair of hole dopants in Ca2CuO2Cl2 Mott insulator".Science Bulletin 66.14(2021). |
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